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NI Semiconductor Test Systems

Lower the Cost of Test With STS

The PXI-based NI Semiconductor Test System (STS) combines modular instrumentation and system design software for RF and mixed-signal production test.

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Designed for the Mainstream Semiconductor Production Environment

The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.

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Featured Content

Look Inside STS

See how STS makes it easy to integrate
NI PXI into a semiconductor production
test environment.

Watch the video

Reduce the Cost of Test

IDT not only reduced its cost of test with STS but also has the flexibility to grow its test coverage to meet emerging test requirements.

Read the case study