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National Instruments PXI Roadshow


PXI Roadshow

NI PXI Roadshow 2016


Smart devices are creating an inflection point in automated test for both the test managers and engineers challenged with ensuring the quality of these devices at increasingly lower costs, and the vendors that serve them. To test their smart devices, organizations are transitioning from the status quo of rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems that scale with escalating requirements to continually shorten time to market and drive down cost.


NI’s approach to automated test empowers smarter test systems. With a platform built from the ground up for customization—either through the latest commercial technology or through your domain knowledge—you become part of a living, breathing, and evolving ecosystem that’s already responsible for creating innovative approaches to automated test across every industry. No other technology company in test and measurement spends more on R&D to upgrade the intelligence of your test system. No other vendor has the track record of growth and commitment to collaborating with our customers. And we’re only getting started.


As the devices you have to test become smarter, you are left with a question: Do I trust my instrument vendor to innovate fast enough for my business needs? Or perhaps more importantly, is it worth risking your business to find out?


Whether you're buying or building your next test system, you need a smarter approach to test. The NI combination of an open platform and thriving ecosystem give you the confidence to trust yourself in testing smart devices. Don’t believe us? Check out the business impact of our approach across industries and applications. Join us at the NI PXI Roadshow in Singapore  , where you can interact with business and technology leaders working hard to lower their cost of test and time to market. This roadshow also introduces the benefits and applications of PXI and highlights the latest NI technology for semiconductor test as well as modular RF instrumentations. Just don’t delay—your DUT is getting smarter by the minute.


Singapore- 6 May
2:00pm- 5:00pm

Suntec Singapore Convention & Exhibition Centre
1 Raffles Boulevard Suntec City
Singapore 039593
Room - MR 311 & 312 (Level 2)


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13:30 Registration
14:00 Introduction to Automated Test and PXI 
Ng Yousi, Area Sales Manager, National Instruments

Identifying the Hardware Platform for Measurement Needs

Gobinath Tamil Vanan, Marketing Engineer,
National Instruments  
15:00 Tea Break
15:30 STS Topic
Neo Wei Ren, Business Development Manager,
National Instruments


Improve System Throughput and Test Times Using the Latest Technologies and Buses

Lou Kwok Hou, Field Sales Engineer, National Instruments


Create Dependable Test Solutions Using the PXI platform and Expansive Software Options

Guo Min, District Sales Engineer, National Instruments

17:00 Question and Answer Session