You are here

2017 Automated Test Summit Singapore

Automated Test Summit 2016

Automated Test Summit, Singapore

Date: 21 April 2017
Time: 8:30am - 3:00pm
Venue: The Chevrons
Address: 48 Boon Lay Way, Singapore 609961

The engineers in National Instruments here would like to extend a special invitation to you to attend our 2017 Automated Test Summit, a complimentary half day technical event featuring new technologies and innovative approaches for building smart, cost effective automated test systems for Automotive HIL, RF and mixed signal semiconductor test of devices such as RF power amplifiers, MEMS accelerometers, and power management ICs.

Test engineering faces expanding requirements and unprecedented business constraints that affect time to market, cost of test, and staffing levels. As devices become more complex, engineers need to increase the throughput of their test systems, reduce maintenance costs, and explore lower cost solutions.

Learn how NI’s platform approach can prepare you for the test implications of these emerging technologies and how you can reduce your characterization and final manufacturing test costs and time to market. Discover how hundreds of companies build better automated test and measurement systems with a software-defined approach.

 



At the event, you can:

  • Explore PXI, an industry leading, PC-based platform used to build compact, high-performance automated test systems
  • Learn how NI uses platform-based approach to reduce test time and overall system cost
  • Learn why the NI Semiconductor Test System is the best platform to increase the throughput of your test system while reducing test cost.
  • Learn how the new Digital Pattern Instrument and the Second Generation Vector Signal Transceiver can improve your tests and test data
  • View live demonstrations of LabVIEW and TestStand software using a variety of modular instruments to perform functional tests on a unit under test

Why you should attend

This summit is designed for test engineers who are new to National Instruments automated test platform. It provides an overview of using LabVIEW for test, which would apply best to those who build test, measurement, or research and analysis applications. If you are looking for ways to increase the throughput of your test systems, reduce your maintenance costs, and explore lower cost solutions, this is the right place to be.

 

  

Please note that registration is required to attend this complimentary event.

 

Smart devices are creating an inflection point in automated test for both the test managers and engineers challenged with ensuring the quality of these devices at increasingly lower costs. To test their smart devices, organizations are transitioning from the status quo of rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems on the PXI platform that scale with escalating requirements to continually shorten time to market and drive down cost.

 

8:30am Registration
9:10am
 

Keynote: Lowering the Cost of Test while Improving Time-To-Market with a Platform-based Approach
Ng Yousi, Area Sales Manager, National Instruments 

The traditional closed approach of boxes in labs and ATE in production, although still prevalent in many IC companies, is not scaling up to the demands of smart devices. This disconnected approach itself is becoming a business risk in order to meet both time to market and cost demands. NI’s single platform approach, streamlined across all phases of test from lab to production floor open the doors for leverage and productivity gains never possible before, ultimately helping IC makers meet the key business needs of faster time to market and lower cost.

10:10am

Morning Tea Break

10:30am

Modeling the Total Cost of Ownership (TCO) of an Automated Test System
Guo Min, District Sales Manager & Wu Rong, Technical Marketing Manager, National Instruments 

Do you really know how much you’re spending on test?  Do you have the tools you need to sell a lower-cost approach within your organization? If you’re like most test directors, the answer to both of these questions is probably "no."  Many leaders struggle to understand and model exactly how much they’re spending on the design, development, deployment, and operation and maintenance of an automated test system – either in validation/verification, characterization, and/or production test. In this session, we will share tools and insights/approaches that help you model the total cost of test for (choose one: electronic, wireless, or semiconductor) devices.  As a result of attending, you will be better equipped to calculate how much you’re actually spending on test, and identify ways to reduce your test cost.  In addition, you will also be better prepared to develop and deliver this insight and data internally within your organization.

11:10am

ATE-Class Digital for Semiconductor Functional Test
Neo Wei Ren, Semiconductor Business Development Manager, National Instruments 

NI has introduced the first ever modular instrument that implements the digital test paradigm and features of semiconductor production testers. This instrument is a monumental improvement in connecting the workflow and data of characterization and production engineers in semiconductor. At this session, learn how NI software and hardware can become your preferred ATE and how the new digital pattern instrument can improve your tests and test data.

11:50am

Lunch

1:00pm

A Platform Based Approach for Embedded Software Testing in Automotive Applications
Jeffrey Wong, Field Sales Engineer, National Instruments

As vehicles continue to strive for autonomous driving, the software being installed in them and the technology they leverage become more complex and intertwined. This creates an explosion in the number of test scenarios that need to be validated.  Learn how an open platform-based approach to HIL test can help you increase test speed, keep pace with future technologies as they are integrated into vehicles, and maximize test coverage.

1:30pm

RFIC Testing from R&D to Production: Advanced Technologies for DPD & ET
Malay Duggar, Senior RF Business Development Manager, National Instruments 

With the explosion of wireless technology, engineers are increasingly required to transition RFIC's from R&D to production test more quickly - and at a lower cost.  Come learn how latest tools and systems are helping engineers reduce both the cost of test and time to market.  In this session we will review some of the key technologies required for testing RFICs in R&D such as envelope tracking (ET) and digital pre-distortion (DPD).

2:10pm

From the Experts: Automated Test Best Practices
Gobinath Tamil Vanan, Field Technical Marketing, National Instruments 

Obtain best practices for building automated test systems, from analyzing test requirements and developing the tester architecture to optimizing test throughput and deploying test systems. This session is based on NI's Practical Guides for Building a Test System series, which were written in collaboration with various leading companies in the Automated Test industry.

2:40pm Networking Session

 

 

With the proven benefits of reducing cost, size, and footprint, the adoption of PXI-based semiconductor production test systems to address DC, Mixed Signal, RF & Digital Tests are on the rise. Even with hundreds of these systems already deployed, building your own test system is not a trivial task. It requires a team of engineers to build and support it, and most companies can't justify it. What you really need is a system that easily integrates into the production environment. See how NI has further evolved PXI to address this problem with the release of the Second Generation VST & Digital Pattern Instruments.

 

Bringing Semiconductor ATE-Class Digital to the Open PXI Platform

The PXI Digital Pattern Instrument delivers ATE-class digital to the industry-standard PXI platform for testing a broad range of RF and mixed-signal integrated circuits (ICs). The NI PXI platform and NI Semiconductor Test System (STS) are an ideal platform for characterization and production test of RF and mixed-signal ICs from RF front ends and power management ICs to transceivers and Internet of Things systems on chip with built-in connectivity and sensors.

Learn more about DPI
See the DPI in Action

Build your Test Applications with NI PXI and TestStand

Smart devices are creating an inflection point in automated test for both the test managers and engineers challenged with ensuring the quality of these devices at increasingly lower costs, and the vendors that serve them. To test their smart devices, organizations are transitioning from the status quo of rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems that scale with escalating requirements to continually shorten time to market and drive down cost. The industry is taking advantage of the latest technologies, such as FPGAs, to meet increasing device complexity, configuring them in software to create customized testing solutions for their evolving system requirements and needs.

Learn more about PXI
See the PXI in Action

 

 

The Future of RF Design & Test Systems

NI’s second-generation PXI Vector Signal Transceiver (VST) offers 1 GHz of instantaneous RF bandwidth for signal generation and analysis. The PXIe-5840 VST combines a 6.5 GHz RF vector signal generator, 6.5  GHz vector signal analyzer, user-programmable Virtex-7 690T FPGA, and high-speed serial interface into a single 2-slot PXI module. Built on the LabVIEW reconfigurable I/O (RIO) architecture, it delivers programming flexibility and cutting-edge RF hardware to help you meet the most challenging RF applications.

Learn more about VST 2.0
See the VST 2.0 in Action